Xplor-NIH now incorporates the functionality of the FX-PLOR package of computer programs for macromolecular refinements against X-ray fiber diffraction data (Wang and Stubbs, 1993; Denny et al., 1997). Most features in X-PLOR suitable for crystal structure refinement and structure analysis can be utilized for fiber structure refinement and analysis.
In X-ray fiber diffraction, the Fourier-Bessel structure factor
is defined as:
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(15.1) |
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(15.2) |
Fiber diffraction intensities are usually
measured at small sampling unit along the layer line,
where
is a constant in reciprocal space. Because the
sampling unit is usually small, it is convenient to index the
intensity data with reciprocal space index
and layer line number
. In FX-PLOR,
and
are stored in H array and L array,
respectively. Moreover, because structure factor
in
fiber diffraction is a multidimensional vector rather than a
two-dimensional vector, only amplitude of
is stored in
the real components of FCALC array and FOBS array.
In order to include X-ray fiber diffraction information in a
molecular dynamics refinement or energy minimization, the
effective energy for fiber diffraction is defined as a function
of the discrepancy between observed and calculated intensities:
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(15.3) |
To reduce computational time, look-up tables for ,
and Bessel function may be set up for structure factor
calculation, The size of the Bessel look-up table depends on
the following factors: resolution limit of the diffraction data,
maximum number of Bessel terms on a layer line (BLMAX) and grid
size of the table for Bessel function (TGRID).
The basic symmetry relation of a helical structure is a screw
rotation . In FXPLOR, these symmetry relations can
be utilized in potential energy calculation for non-bonded
interactions between atoms in different subunits. The rotation
matrix
of the screw rotation is:
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(15.6) |
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(15.8) |
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(15.9) |